Equivalence Analysis of Dielectric Loss Test Value of Capacitive Devices under Different Voltage

LYU Zecheng; ZHANG Wei; DENG Yurong; TAO Songmei; WU Qiuli

doi:10.3969/j.issn.1000-7229.2013.10.010

LYU Zecheng， ZHANG Wei， DENG Yurong， TAO Songmei， WU Qiuli

Electric Power Construction ›› 2013, Vol. 34 ›› Issue (10) : 49-52.

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Electric Power Construction ›› 2013, Vol. 34 ›› Issue (10) : 49-52. DOI: 10.3969/j.issn.1000-7229.2013.10.010

Equivalence Analysis of Dielectric Loss Test Value of Capacitive Devices under Different Voltage

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 34(10): 49-52 https://doi.org/10.3969/j.issn.1000-7229.2013.10.010

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Administrator：State Grid Corporation of China
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