&nbsp; Resonance Oscillation and Discharge Phenomenon Caused by Capacitance-Type DC Bias Suppression Device Under Fault &nbsp;
&nbsp;

ZHENG Tao; ZHANG Zihang

doi:10.3969/j.issn.1000-7229.2018.05.008

Resonance Oscillation and Discharge Phenomenon Caused by Capacitance-Type DC Bias Suppression Device Under Fault

ZHENG Tao，ZHANG Zihang

Electric Power Construction ›› 2018, Vol. 39 ›› Issue (5) : 63.

PDF(2053 KB)

Electric Power Construction ›› 2018, Vol. 39 ›› Issue (5) : 63. DOI: 10.3969/j.issn.1000-7229.2018.05.008

Resonance Oscillation and Discharge Phenomenon Caused by Capacitance-Type DC Bias Suppression Device Under Fault

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

Abstract

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 39(5): 63 https://doi.org/10.3969/j.issn.1000-7229.2018.05.008

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

Funding

RIGHTS & PERMISSIONS

PDF(2053 KB)

Accesses

Citation

Detail

Sections

Recommended

Administrator：State Grid Corporation of China
Sponsors：
State Grid Economic and Technological Research Institute Co. Ltd
China Power Engineering Consulting Group Co., Ltd
China Electric Power Research Institute
Editor in Chief: Zhang Quan
Associate Editor-in-Chief:KANG Chongqing, BI Tianshu, LI Hui
Executive Editor-in-Chief:YANG Weihong, SHENG Yi
Editorial Director:WEI Xihui
CN: 11-2583/TM
ISSN: 1000-7229

Address: Tower A225, SGCC, Future Science & Technology Park, Beijing 102209, China
Post Code: 102209
Editor’s Tel: 86-10-66602697
Advertisement Tel: 86-10-66602693
E-mail：dljs@263.net
Web Site: http://www.cepc.com.cn
Post Issue Number: 82-679
CODEN: DJIIAQ

Please choose a citation manager

Content to export